Many research and productionapplications require low-level voltage measurements to characterize materialsand devices. When signal voltages approach the microvolt ...
Journal of Educational Measurement, Vol. 14, No. 2, Applications of Latent Trait Models (Summer, 1977), pp. 97-116 (20 pages) This paper explains the Rasch model for sample-free item analysis and test ...
This is a preview. Log in through your library . Oikos is a journal issued by the Nordic Ecological Society and is one of the leading peer-reviewed journals in ecology. Oikos publishes original and ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback